Electronic Design, Band 16,Ausgaben 16-20Hayden Publishing Company, 1968 |
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... temperature . As we allow 7 , the temperature of the system , to vary over its specified range , region R * will , in general , move and change shape . This is because the limit tolerances vary with temperature ( Fig . 4 ) . If the ...
... temperature . As we allow 7 , the temperature of the system , to vary over its specified range , region R * will , in general , move and change shape . This is because the limit tolerances vary with temperature ( Fig . 4 ) . If the ...
Seite 56
... temperature and low - temperature testers to test all the units he manufactures . He therefore goes to great extremes to thoroughly character- ize his product at high temperature and low tem- perature , and come up with guard - banded ...
... temperature and low - temperature testers to test all the units he manufactures . He therefore goes to great extremes to thoroughly character- ize his product at high temperature and low tem- perature , and come up with guard - banded ...
Seite 89
... temperature range for which the manufacturer specifies P , T. T1 the temperature range for which ratio is desired , and Rn3 / Rn the resistance ratio given by the nominal curve . Ꭲ T3 = ~ The basis for Eq . 5 is simply the rule of logs ...
... temperature range for which the manufacturer specifies P , T. T1 the temperature range for which ratio is desired , and Rn3 / Rn the resistance ratio given by the nominal curve . Ꭲ T3 = ~ The basis for Eq . 5 is simply the rule of logs ...
Inhalt
Heres how | 45 |
More than 70 illustrations | 138 |
Paste up decals Partition | 62 |
Urheberrecht | |
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2-input Allen-Bradley amplifier applications binary BINARY ELEMENTS Booth Calif capacitance capacitors catalog CIRCLE clock Company components connectors Corp cost counter delay devices diodes display dual 4-input Electric ELECTRONIC DESIGN engineering equipment Fairchild film frequency gate Hewlett-Packard hybrid IC testing impedance industrial INFORMATION RETRIEVAL NUMBER input instrument integrated circuits J-K flip-flop laser linear logic manufacturer measurements meter microwave Model modules Motorola NAND National Semiconductor Noise Immunity ohms Operating Temperature Range optical oscillator oscilloscope output P.O. Box package parameters performance Phone plug-in potentiometer Power Dissipation power supply problems production pulse quad 2-input relays reliability resistance resistor Semiconductor signal specifications standard substrate switch synchro tape techniques Tektronix tester tion transistors tube Type unit values voltage volts WESCON wire